MSE 2350 - Advanced Scanning Electron Microscopy

Credits: 2

In this course students attain operational proficiency in use of the field emission scanning electron microscopes such as the Quanta 600, and the Hitachi S4800. Students will conduct compositional analysis using the EDAX and EDBSE systems, and understand focused ion beam (FIB). Includes both theory and practical applications.

Prerequisite: MSE 2330
Semesters Offered: Fall & Spring

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