MSE 2320 - Introduction to Scanning Probe Microscopy

Credits: 2

Theory and practice related to the use of Scanning Probe Microscopes, including Atomic Force Microscopes (AFM) and Scanning Tunneling Microscopes(STM). Experience with Contact Mode, Tapping Mode and Friction Mode and lithographic applications such as dip pen lithography and nano shaving. Students will create their own samples as well as imaging commercially available samples.

Prerequisite: CHEM 1110
Semester: Fall

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